SEU-Tolerant QDI Circuits

نویسندگان

  • Wonjin Jang
  • Alain J. Martin
چکیده

This paper addresses the issue of Single-Event Upset (SEU) in quasi delay-insensitive (QDI) asynchronous circuits. We show that an SEU can cause abnormal computations in QDI circuits beside deadlock, and we propose a general method to make QDI circuits SEU-tolerant. We present a simplified SEUtolerant buffer implementations for CMOS technology. Finally, we present a case study of a one-bit comparator and show SPICE-simulation results.

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تاریخ انتشار 2005